Syllabus
Every item below represents ca two-hour lecture; the trainings can last up to one day, according to the interest of the students.
ELECTRON MICROSCOPY
Introduction to Electron Microscopy (M. Slouf): similarities and differences among light microscopy (LM), transmission electron microscopy (TEM), and scanning electron microscopy (SEM). Relation of microscopy and Mathematics, Physics, Chemistry and Biology. Basic description and principles of SEM and TEM: ray optics, wave optics, diffraction, resolution, typical modes of SEM and TEM. Typical applications in various fields of science.
SEM1 = basics of scanning electron microscopy (M. Slouf). Detailed description of a SEM microscope and its four basic modes (SE, BSE, EDX, and STEM). High-, low-vacuum microscopy. Sample preparation. Interpretation of SEM micrographs. Real-life examples and applications.
SEM2 = microanalysis (M. Slouf, optional, for advanced students). More detailed explanation of SEM/EDX, including ab initio calculations of EDX energies using Schrodinger equation (by means of freeware program wxMaxima).
TEM1 = basics of transmission electron microscopy (M. Slouf). Detailed description of a TEM microscope and its four basic modes (BF, DF, SAED, and EDX). Conventional, analytical, high-resolution, and 3D-TEM. Sample preparation. Interpretation of TEM micrographs. Real-life examples and applications.
TEM2 = electron diffraction (M. Slouf, optional, for advanced students). More detailed explanation of TEM/SAED using three different levels: 1. Bragg equation, 2. Laue diffraction conditions, and 3. Kinematic diffraction theory. Calculation of a simple diffraction pattern (by means of freeware program wxMaxma).
Image analysis (M. Slouf). Interpretation of signal and contrast in electron micrographs. Principle of image analysis (conversion of micrographs to numbers). Software for image analysis (ImageJ). Types of image analysis (object analysis vs. field analysis). Real-life examples.
SPM/AFM MICROSCOPY
Introduction to scanning probe microscopy (SPM; Z. Pientka). Brief intro to SPM (principle, resolution, scales, magnifications). Selected types of SPM: atomic force microscopy (AFM), scanning tunneling microscopy (STM), scanning near-field optical microscopy (SNOM).
Atomic force microscopy (AFM; Z. Pientka). Brief intro (principle, properties of cantilevers and tips). Sample usage in the field of polymer morphology (polymer blends, polymer membranes, thin layers, macromolecules in physiological conditions, metrology, and quality control).
Measurement of small forces (Z. Pientka). Morphology of heterogeneous samples, local measurement of viscoelastic parameters, study of intermolecular interactions (biology), measurement of surface roughness and adhesion (industry), measurement of magnetic forces (magnetic domains in hard drives).
Scannint tunneling microscopy (STM; Z. Pientka). Principle of the method, atomic resolution, morphology of semiconductors, nanomanipulation with single atoms, observation of quantum effects.
Scanning near-field optical microscopy (SNOM; Z. Pientka). Principle of the method and microspectroscopy. Surface-enhanced Raman spectroscopy (SERS). Analysis of micrographs, Fourier transformation (FFT).
Nanotechnology (Z. Pientka). AFM lithography, photolithography, and electron lithography. Production of computer chips, micro- and nanomanipulation, and rotaxanes.
TRAINING – for selected/interested students
Training 1 – basics of SEM.
Training 2 – basics of TEM.
Training 3 – basics of AFM.
Training 4 – AFM beyond the basics.
Annotation
A course about modern microscopic methods for MSc and PhD students of Chemistry (and similar subjects). The course covers both theoretical background and real-life applications of electron microscopy and scanning probe microscopy.
More interested students can pass also basic training on modern SEM, TEM and AFM microscopes.