Syllabus
1. Electron microscopy
Basic principles of electron microscopy imaging, magnification, point resolution, contrast, chromatic and spherical aberration. Transmission and scanning electron microscopy, detection in SEM/STEM methods, interaction of electrons with the sample, EDS and EELS techniques. Sample preparation, cryogenic transmission electron microscopy 2. Scanning probe microscopy
Basic principles of SPM imaging, atomic force microscopy in contact, semicontact and noncontact mode, scanning tunelling microscopy 3. Scattering methods
Introduction to scattering theory, scattering vector, scattering length and scattering cross-section, form factor and structure factor. Analysis of scattering curves. Dynamic light scattering, intensity autocorrelation function, translational and rotational diffusion coefficient from DLS. Ligh, X-ray and neutron scattering measurements - radiation sources, detection and calibration.
Annotation
Introduction to microscopic and scattering methods. The course combines lectures comprising both theoretical principles of the methods and their instrumentation with practical courses.