Syllabus
Sylabus:
1. Introduction
2. History of TEM
3. Lens aberrations
4. TEM machine
5. Diffraction
6. Reciprocal lattice
7. Scattering
8. Dynamical effects
9. Image formation
10. Pahe contrast, Z-contrast
11. HRTEM
12. STEM
13. ED methods
14. cRED
15. Use of TEM methods for your research
Annotation
This course will cover the fundamentals of transmission electron microscopy (TEM) in materials sciences.
Graduating this course, students will be able to understand research where TEM has been used and have the necessary theoretical basis for taking a practical training on the TEM (which is also a part of this course).
TEM provides access to structural and chemical information from the micrometer to the sub-angstrom scale.
Sample can be analyzed towards the crystallinity, grain structure, size, and defects, and the chemical composition.
The crystal lattice can be imaged with atomic resolution, allowing observation of grain boundaries and interfaces. It is one of the most direct structural analysis methods for studying nanoparticles. A comprehensive introduction to transmission electron microscopy will be supplemented with practical exercise on use of the microscope, data processing, and image analysis.
Recommended background: Basics of crystallography and diffraction, more advanced crystallography and solid- state physics are of advantage.