Syllabus
* 1. Introduction to near field microscopy techniques
Physical principles of near field microscopy techniques: scanning tunneling microscopy (STM), atomic force microscopy (AFM), scanning near field optical microscopy (SNOM). Other related techniques: scanning tunneling spectroscopy - STS, ballistic electron emission microscopy - BEEM, scanning tunneling potentiometry - SPT, scanning noise microscopy - SNM, scanning capacitance microscopy, scanning noise microscopy and scanning thermal microscopy. Other scanning force microscopy techniques: magnetic force (MFM) and electric force (EFM) microscopies, DC and AC techniques, contact, semi-contact and non-contact modes, single and multiple path techniques.
* 2. Physical principles, applications
Resolution, modes of measurement, construction. Application in surface and thin films physics, comparison with other techniques - transmission electron microscopy (TEM), scanning electron microscopy (SEM), field emission microscopy (FEM), field ion microscopy, low energy electron microscopy (LEEM).
* 3. Latest modifications
The latest modifications and applicability of microscopy techniques in study of surfaces and thin films.
Annotation
Introduction in near field scanning microscopy methods (STM, AFM, SNOM) and related techniques. Physical principles, applications in physics of thin films and surfaces, advantages and limits.
Comparison with traditional electron microscopy techniques (TEM, SEM), field emission and field ion microscopes (FEM, FIM) and LEEM technique. The latest modifications and applicability of microscopy techniques.