Syllabus
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1. Methods based on the ion impact *
2. Charge exchange between ions and surface Spectroscopy based on a neutralisation of incident ions (Ion Neutralisation Spectroscopy). Neutralisation by means of Auger transfer, deexcitation, experimental arrangement. *
3. Ion scattering, methods based on it Ion Scattering Spectroscopy and its modifications (LEIS, HEIS). *
4. Ion sputtering, depth profiling Collision cascade, sputtering yield, depth resolution. *
5. Secondary Ion Mass Spectroscopy (SIMS) Ion yield, energy spectrum of secondary ions, static and dynamical SIMS. Experimental arrangement. *
6. Electronically Stimulated Desorption (ESD) Principles, arrangement, detection. Time-of-flight and other analysis techniques. *
7. Atomic and molecular beam scattering Beam - surface interaction, elastic and non-elastic scattering, instrumentation. *
8. Other methods based on the ion spectroscopy
Annotation
Charge exchange between ions and surface, spectroscopy based on a principies of neutralization incident ions (INS) and ion scattering (ISS). Ion sputtering, depth profiling.
Secondary ion mass spectroscopy (SIMS). Neutral particles scattering on the surfaces.
Electron stimulated desorption.