Syllabus
1. Kinematic theory of diffraction by real crystals. Krivoglaz theory, diffraction by ideal and real crystal, classification of lattice defects from the point of view of diffraction pattern, possibilities of their study.
2. Residual stresses. Classification of stresses, description of stresses, stresses in thin films Stress measurement, triple-axis stresses.
3. Textures General description of texture, pole figures, ODF, textures in thin films, residual stresses in textured samples, texture and physical properties
4. Line profile analysis Correction of instrumental broadening, size-strain separation by different methods.
5. Study of lattice defects from line broadening Dislocations and dislocation structures. Stacking faults.
6. Study of crystallite size, shape and distributions.
7. Study of lattice defects from change of diffracted intensities. Description of displacement field, lattice parameter changes, static displacements, Debye-Waller factors
8. Diffuse scattering. Thermal and structure diffuse scattering, geometrical and chemical disorder Huang scattering by point defects and their clusters
9. Scattering by precipitates and dislocation loops.
10. Defects in single crystals. X-ray topography.
11. Small-angle scattering.
Annotation
Kinematic theory of diffraction by real crystals. Study of lattice defects, size and shapes of crystallites, residual stresses, textures, lattice vibrations.
Diffuse scattering. Small-angle scattering.
X-ray topography.