Analysis of fine structure of diffraction patterns, phase analysis, analysis of various kinds of lattice imperfections, analysis of composition, determination of foil thickness, fundamental principles of image simulation and processing, employment of microdiffraction, weak beam and convergent beam electron diffraction techniques.
For undergraduate students of grade 4 and 5 and graduate students.
Analysis of fine structure of diffraction patterns, phase analysis, analysis of various kinds of lattice imperfections, analysis of composition, determination of foil thickness, fundamental principles of image simulation and processing, employment of microdiffraction, weak beam and convergent beam electron diffraction techniques.
For undergraduate students of grade 4 and 5 and graduate students.