Syllabus
A. SURFACE STRUCTURE Importance of surface structure study. Surface relaxation and reconstruction. 2D Bravais lattices. Wood´s notation. Matrix notation. Steps and facets. Surface structures. Diffraction on 2D lattice. Ewald construction. Diffracting beam description. B. METHODS OF STUDY OF SURFACE STRUCTURES AND THIN FILMS Methods of clean surface preparation.
1. Diffraction of electrons and positrons. LEED - basic characteristics and principle, experimental setup, electron scattering in crystal, mutliple scattering, surface lattice defects, phase transitions. Thermal vibrations. Debye-Waller factors. Anisotropic vibrations. MEED, RHEED, LEPD - principles and applications.
2. Scattering of atoms and ions. Diffraction of atoms - interaction of atoms with surface, experimental setup, applications (charge density distribution, hydrogen chemisorption, reconstruction, surfaces of insulators, incommensurate structures) Ion scattering (ISS) - LEIS, MEIS, HEIS (RBS). Principles, peak intensity, study of atomic displacements, reconstructed and relaxed surface, adsorbates, interfaces, surface melting)
3. Spectroscopic methods - UPS, XPS, AES (structure information) - SEXAFS, NEXAFS Principles, study of local structure in disordered materials, study of bonding and orientation of adsorbed molecules, coordination numbers, chemisorption, interface solid-thin film).
4. Some other methods (ESDIAD, TSD, HREELS, ...)
5. Microscopy of surfaces - FEM (principle, tunneling, experimental setup, resolution, applications - FIM (principle, setup, resolution, atomic imaging) - STM (discovery, development, principle, modes of measurement, resolution, setup, applications) - HRTEM (basic differences from conventional TEM)
6. X-ray diffraction Double- and triple crystal diffractometry (diffraction in perfect crystals, epitaxial layers - strains, composition, depth profiling) Glancing angle diffraction - total reflection, amorphous thin films, implanted films, surfaces. GID - grazin angle diffraction. Standing-wave method (secondary radiation, registration of photoelectrons, fotoemission, fluorescence, Compton scattering) Study of polycrystalline thin films. Structural pecularities of thin films, mechanical properties. Conventional powder diffraction (pahse analysis, texture, stress, strain, crystallite size). Stress determination. Low-angle diffraction. Examples, hard coatings.
Annotation
Surface crystallography. Methods - LEED, scattering of ions and atoms (ISS, RBS, ...).
Microscopic methods (FIM, STM, AFM ...). X-ray structure analysis of polycrystalline and single crystal thin films.