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X-ray Study of Real Structure of Thin Films

Class at Faculty of Mathematics and Physics |
NFPL149

Syllabus

Application of kinematic and dynamic diffraction theory to study of the structure and morphology of polycrystalline, nanocrystalline and amorphous thin films and low-dimensional structures.

High-angle and low-angle scattering. Fundamentals of dynamic theory of diffraction and their applications for the study of epitaxial layers. Basic experimental techniques used for X-ray diffraction study of real structure of thin films.

Annotation

Application of kinematic and dynamic diffraction theory to study of the structure and morphology of polycrystalline, nanocrystalline and amorphous thin films and low-dimensional structures.

High-angle and low-angle scattering. Fundamentals of dynamic theory of diffraction and their applications for the study of epitaxial layers. Basic experimental techniques used for X-ray diffraction study of real structure of thin films.