Class at Faculty of Mathematics and Physics |
NFPL307
Syllabus
Sample preparation for electron microscopy .
Basic principles and controlling of scanning electron microscope.
Imaging using secondary and back-scattered electrons.
Chemical analysis by means of EDX and WDX.
Analysis of crystallographic orientation and texture by means of EBSD.
Annotation
Sample preparation for electron microscopy .
Basic principles and controlling of scanning electron microscope.
Imaging using secondary and back-scattered electrons.
Chemical analysis by means of EDX and WDX.
Analysis of crystallographic orientation and texture by means of EBSD.