Publications
- In-situ X-ray diffraction studies of time and thickness dependence of crystallization of amorphous TiO2 thin films and stress evolution2010 | Faculty of Mathematics and Physics
- XRD total pattern fitting applied to study of microstructure of TiO2 films2010 | Faculty of Mathematics and Physics
- XRD study of thickness dependence of crystallization and stresses in TiO2 thin films2009 | Faculty of Mathematics and Physics
- Microstructural characterization of nanocrystalline powders and thin films by X-ray powder diffraction2009 | Faculty of Mathematics and Physics
- Crystallization and Microstructure Evolution of TiO2 Thin Films and Powders Studied by XRD Total Pattern Fitting and Stress Analysis2009 | Faculty of Mathematics and Physics
- X-ray diffraction investigations of TiO 2 thin films and their thermal stability2012 | Faculty of Mathematics and Physics
- X-Ray Diffraction Analysis of Residual Stress in Thin Polycrystalline Anatase Films and Elastic Anisotropy of Anatase2011 | Faculty of Mathematics and Physics
- Structure and Composition of Titanium Nanocluster Films Prepared by a Gas Aggregation Cluster Source2011 | Faculty of Mathematics and Physics
- Coplanar grazing exit X-ray diffraction on thin polycrystalline films +12009 | Faculty of Mathematics and Physics
- Time and thickness dependence of crystallization of amorphous magnetron deposited TiO2 thin films2009 | Faculty of Mathematics and Physics
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