Publications
- Effect of Ti interlayer and bias on structure and properties of TiN films2000 | Faculty of Mathematics and Physics, Central Library of Charles University
- Thickness determination of thin polycrystalline films by grazing incidence X-ray diffraction2004 | Faculty of Mathematics and Physics, Central Library of Charles University
- Thickness determination of thin polycrystalline film by grazing incidence X-ray diffraction2001 | Faculty of Mathematics and Physics, Central Library of Charles University
- Thickness determination of thin polycrystalline film by asymmetric X-ray diffraction with variable incidence of primary beam at low angles2001 | Faculty of Mathematics and Physics, Central Library of Charles University
- Structure study of Fe/Au multilayers1999 | Faculty of Mathematics and Physics
- Local ordering in magnetic multilayers as seen by X-ray diffraction1998 | Faculty of Mathematics and Physics
- Characterization of the real structure of ultra thin magnetic multilayers using X-ray reflectivity1998 | Faculty of Mathematics and Physics
- Rtg. difrakční studium tenkých PVD vrstev TiN1997 | Faculty of Mathematics and Physics
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