Publication at Faculty of Mathematics and Physics |
2010
Abstract
The interaction of Pt with CeO2 layers was investigated by using photoelectron spectroscopy. The 30 nm thick Pt doped CeO2 layers were deposited simultaneously by rf-magnetron sputtering on a Si(001) substrate, multiwall carbon nanotubes (CNTs) supported by a carbon diffusion layer of a polymer membrane fuel cell and on CNTs grown on the silicon wafer by the CVD technique.
The synchrotron radiation X-ray photoelectron spectra showed the formation of cerium oxide with completely ionized Pt-2+,Pt-4+ species, and with the Pt2+/Pt4+ ratio strongly dependent on the substrate. The TEM and XRD study showed the Pt2+/Pt4+ ratio is dependent on the film structure..