Characterization of ZnO nanostructures: A challenge to positron annihilation spectroscopy and other methods

Abstract

ZnO nanostructures are of special interest for device applications. However, their structural characterization remains an ongoing challenge.

This paper reviews recent efforts and latest achievements in this direction. Results comprise PAS in the form of Slow Positron Implantation Spectroscopy (SPIS) and Pulsed Low Energy Positron Lifetime Spectroscopy (PLEPS), Nuclear Reaction Analysis (NRA), Atomic Force Microscopy (AFM), conductive AFM (C-AFM), Nuclear Magnetic Resonance (NMR), Electron Spin Resonance (ESR), Photoluminescence (PL) spectroscopy, and latest theoretical investigations of structure-related and positron properties of selected defects.

Keywords

• ZnO
• Nanostructures
• Positron Annihilation Spectroscopy.