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Vacuum-ultraviolet ellipsometry spectra and structural properties of Pb(Zr,Ti)O3 films

Publication at Faculty of Mathematics and Physics |
2011

Abstract

Optical properties of PbZrxTi1 - xO3 material have been actively studied in the visible and near band-gap region, but data in the vacuum-ultraviolet spectral region is rather scarce. In this work we focus on well known interband transitions for the perovskite materials located in VUV spectral region.

Dielectric functions of chemical solution deposited and sputtered PZT were obtained in the spectral range 1-8.8 eV. Differences between the absorption maxima for chemical solution deposited and sputtered PbZrxTi1 - xO3 samples near Kahn-Leyendecker interband transition were found and are interpreted by change of interatomic distances.

This is confirmed by different lattice constants. In the case of PbZrxTi1 - xO3 film with microcracks, the void fraction was estimated from the effective medium approximation.

Direct band-gap energies appear to be nearly the same for all reactive sputtered samples weakly depending of Zr/Ti concentration.