X-ray interference effects on the determination of structural data in ultrathin La(2/3)Sr(1/3)MnO(3) epitaxial thin films
2011
Abstrakt
We analyze x-ray diffraction data to extract cell parameters of ultrathin films on closely matching substrates. We focus on epitaxial La2/3Sr1/3MnO3 films grown on (001) SrTiO3 single crystalline substrates.
It will be shown that, due to extremely high structural similarity of film and substrate, the data analysis must explicitly consider the distinct phase of the diffracted waves by substrate and films to extract reliable unit cell parameters. The implications of this finding for the understanding of strain effects in ultrathin films and interfaces will be underlined.