Publikace na Matematicko-fyzikální fakulta |
2011
Abstrakt
Analysis of metal/dielectric composite films in the ohmic regime of conductivity has been done by computer simulation. The computer experiment consists of the generation of model composite structures, analysis of their morphology using percolation theory methods, analysis of a network of resistors, measurement of the resistance, and a study of the correlation between structural parameters and the resistance of the structure.
This correlation was analysed and an interesting behavior of the resistance of the structure was found.