Publikace na Matematicko-fyzikální fakulta |
2011
Abstrakt
The surface structure of a single-crystal ZnO wafer was studied by angle-resolved x-ray photoelectron spectroscopy (ARXPS) using synchrotron radiation. As a result, well-defined x-ray photoelectron diffraction (XPD) patterns were obtained for the (0001) and (000 (1) over bar) polar surfaces using the photoemission from the Zn 2p(3/2) and 0 1s core levels.
The XPD patterns were indexed assuming forward scattering of photoelectrons by neighboring ions. Further, the XPD patterns for the (0001) and (000 (1) over bar) surfaces were different from each other, indicating the possibility for using the XPD technique for polarity determination. (C) 2011 Elsevier B.V.
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