Abstract
In this study, we present our results of tin interaction with CeO2 (111) surface supported by copper (111) single crystal. The system crystallography was characterized by RHEED (Reflection High-Energy Electron Diffraction), while the stoichiometry was investigated by XPS (X-ray Photoelectron Spectroscopy).
The ceria thin film was prepared by reactive evaporation of metallic cerium in oxygen atmosphere. Deposition of low amount of metallic tin onto the ceria substrate led to the formation of polycrystalline layer of tin oxide (SnOx).
The oxidation of tin is made possible by taking the oxygen from ceria surface, as indicated by evolution of peaks in XPS spectra belonging to Ce3+ state. Subsequent deposition of tin led to the coexistence of two phases on the surface-small epitaxial clusters of metallic tin with (010) crystallographic plane parallel to the surface and polycrystalline tin oxide.
Annealing of the sample up to 250 oC in oxygen atmosphere resulted in the oxidation of metallic tin and disappearance of the epitaxial clusters.