Abstrakt
This program is for measurement of sizes of particles and nanoparticles. It can be useful especially in cases where one needs to determine size distribution of particles from an image where the particles touch or even overlap each other.
It can be useful in any other circumstances (like not completely homogeneous substrate or slightly blurred edges of particles) when images cannot be characterized using common software (e.g. ImageJ) for finding binary threshold between particles and substrate.