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Scintillation efficiency and X-ray imaging with the RE-doped LuAG thin films grown by liquid phase epitaxy

Publikace na Matematicko-fyzikální fakulta |
2012

Tento text není v aktuálním jazyce dostupný. Zobrazuje se verze "en".Abstrakt

Very thin scintillator imaging plates have recently become of great interest. In high resolution X-ray radiography, very thin scintillator layers of about 5-20 mu m are used to achieve 2D-spatial resolutions below 1 pm.

Thin screens can be prepared by mechanical polishing from single crystals or by epitaxial growth on single-crystal substrates using the Liquid Phase Epitaxy technique (LPE). Other types of screens (e.g. deposited powder) do no reach required spatial resolutions.

This work compares LPE-grown YAG and LuAG scintillator films doped with different rare earth ions (Cerium, Terbium and Europium). Two different fluxes were used in the LPE growth procedure.

These LPE films are compared to YAG:Ce and LuAG:Ce screens made from bulk single crystals. Relative light yield was detected by a highly sensitive CCD camera.

Scintillator screens were excited by a micro-focus X-ray source and the generated light was gathered by the CCD camera's optical system. Scintillator 2D-homogeneity is examined in an Xray imaging setup also using the CCD camera.