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Electroluminescence microscopy and spectroscopy of silicon nanocrystals in thin SiO2 layers

Publikace na Matematicko-fyzikální fakulta |
2001

Tento text není v aktuálním jazyce dostupný. Zobrazuje se verze "en".Abstrakt

Stable continuously operable electroluminescent diodes have been fabricated by Si+-ion implantation and annealing of thin SiO2 layers on a silicon substrate. Their emission is studied using an imaging spectroscopy.