Thickness determination of thin polycrystalline film by asymmetric X-ray diffraction with variable incidence of primary beam at low angles | Charles Explorer

Thickness determination of thin polycrystalline film by asymmetric X-ray diffraction with variable incidence of primary beam at low angles

Publikace na Matematicko-fyzikální fakulta, Ústřední knihovna |

2001

Abstrakt

Thickness determination of thin polycrystalline film by asymmetric X-ray diffraction with variable incidence of primary beam at low angles

Osoby