Publication at Faculty of Mathematics and Physics |
2016
Abstract
Rutherford Backscattering Spectrometry was applied to investigate the stability of magnetite thin films including an ion beam bombardment. A series of single layer Fe3O4/MgO(001) and bi-layer Fe3O4/Fe/MgO(001) thin films with different layer thickness was prepared by the Molecular Beam Epitaxy (MBE) technique.
To modify the film interfaces 1 MeV Kr+ ion beam with different ion fluences was used. We observed a pronounced Fe-Mg intermixing effect of the ion irradiation.
The stoichiometric magnetite layer is well preserved even upon ion irradiation with small doses, which indicates a high stability of the Fe3O4 layer under different external conditions.