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Positron Structural Analysis of ScN Films Deposited on MgO Substrate

Publikace na Matematicko-fyzikální fakulta |
2020

Tento text není v aktuálním jazyce dostupný. Zobrazuje se verze "en".Abstrakt

Scandium nitride (ScN) is a semiconductor with a rocksalt-structure that has attracted attention for its potential applications in thermoelectric energy conversion devices, as a semiconducting component in epitaxial metal/semiconductor superlattices. Two ScN films of 118 nm and 950 nm thicknesses were deposited at the same conditions on MgO (001) substrate by reactive magnetron sputtering.

Poly-orientation of films was observed with first an epitaxial growth on MgO and then a change in the orientation growth due to the decrease of the adatom mobility during the film growth. Positron lifetime measurements showed a high concentration of nitrogen vacancies in both films with a slightly higher concentration for the thicker ScN film.

Presence of nitrogen vacancies explains the values of direct band gaps of 2.53 +/- 0.01 eV, and 2.56 +/- 0.01 eV which has been measured on ScN films of 118 nm and 950 nm thicknesses, respectively.