Abstrakt
We report magnetic-field-induced rotation of the antiferromagnetic Neel vector in epitaxial CuMnAs thin films. First, using soft x-ray magnetic linear dichroism spectroscopy as well as magnetometry, we demonstrate spin-flop switching and continuous spin reorientation in films with uniaxial and biaxial magnetic anisotropies, respectively, for applied magnetic fields of the order of 2 T.
The remnant antiferromagnetic domain configurations are determined using x-ray photoemission electron microscopy. Next, we show that the Neel vector reorientations are manifested in the longitudinal and transverse anisotropic magnetoresistance.
Dependencies of the electrical resistance on the orientation of the Neel vector with respect to both the electrical current direction and the crystal symmetry are identified, including a weak fourth-order term evident at high magnetic fields. The results provide characterization of key parameters including the anisotropic magnetoresistance coefficients, magnetocrystalline anisotropy, and spin-flop field in epitaxial films of tetragonal CuMnAs, a candidate material for antiferromagnetic spintronics.