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Characterization of thin free-standing Al-Mg films

Publikace na Matematicko-fyzikální fakulta |
2020

Tento text není v aktuálním jazyce dostupný. Zobrazuje se verze "en".Abstrakt

Small-scale thin films are frequently used in microelectronic devices and micro-electro- mechanical systems where they are commonly subjected to high strains during their dynamic motion. However, mechanical behavior of thin films significantly differs from the behavior observed in bulk materials.