Publication at Faculty of Mathematics and Physics |
2020
Abstract
Black and smooth Al films were characterized by the variable energy positron annihilation spectroscopy (VEPAS). It was found that in smooth films positronium (Ps) is formed on the surface only while in black metal films, it is formed also in nanoscopic pores inside the film.
The mean pore size increases from the substrate to the surface due to increasing film roughness.