In-Situ TEM Deformation of Free-Standing Thin Films and Molecular Dynamics Simulations

Abstract

Mechanical properties of nanocrystalline films have been found to differ from typical features exhibited in bulk coarse grained materials. To gain insight for the casuses of higher yield and tensile strength and lower ductility measured in these films, experiments allowing direct observations of the deformation mechanisms such as in-situ transmission electron microscopy tensile testing as well as molecular dynamics computer simulations can be employed.