X-ray Parametric Down-conversion on III-V Semiconductor Heterostructures

Abstrakt

X-ray parametric down-conversion (XPDC) is a process that converts an X-ray photon into a pair of entangled photons. We aim to measure the XPDC photons utilizing coincidence detection with several modifications that could improve the XPDC efficiency.

We suggest heterostructures of III-V semiconductors as a suitable medium. We pump the heterostructure with a laser pulse to enhance the built-in Stark field, which could modify the output energy spectrum and increase the coincident count rate.