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Crystallization and Microstructure Evolution of TiO2 Thin Films and Powders Studied by XRD Total Pattern Fitting and Stress Analysis

Publication at Faculty of Mathematics and Physics |
2009

Abstract

Different TiO2 samples - magnetron deposited amorphous and nanocrystalline thin films and powders - were annealed both off-situ and in-situ in XRD high-temperature chamber and their microstructure evolution with temperature and time was studied.