Publication at Faculty of Mathematics and Physics |
2009
Abstract
In the present Contribution, an overview of the technique of positron annihilation spectroscopy utilizing variable energy positron beams will be given. This technique is often called as the slow-positron implantation spectroscopy (SPIS).
A possible impact of SPIS for research on ultra fine-grained and nanocrystalline materials will be illustrated by an example of results obtained within the Prague - Dresden collaboration. An information on a slow-positron beam, being under construction at Charles University, Prague, Faculty of Mathematics and Physics, will be given.