Spatial resolution analysis of micron resolution silicon pixel detectors based on beam and laser tests

Abstract

Pixel sensors with micron resolution are being developed by several groups, and this development comes hand in hand with the development of new resolution enhancement methods. This paper summarizes the results of our study of hit reconstruction methods used in analysis of DEPFET.

Keywords

• Spatial
• resolution
• analysis
• micron
• resolution
• silicon
• pixel
• detectors
• based
• laser
• tests