Publication at Faculty of Mathematics and Physics |
2009
Abstract
Noise characteristics of CdTe gamma and X-ray detectors have been carried out. Measurements of high-ohmic detectors with two golden contacts and low-ohmic detectors with four contacts were carried out.
Two voltage contacts were used to distinguish between metal-semiconductor junction area with depleted region and homogeneous part of the sample. The noise characteristics of the samples were measured in dark and with the illumination in the range of radiation from ultraviolet to infrared.