Publication at Faculty of Mathematics and Physics |
2009
Abstract
Technical purity copper and copper with addition of 0.18 wt.% of zirconium samples processed by equal channel angular pressing with different number of passes were studied by X-ray line profile analysis. Dislocation-induced broadening is the dominant effect determining diffraction line shape.
X-ray analysis reveals increasing mean dislocation density (similar to 10(15) m(-2)) with the number of ECAP passes. The character of the deformation field connected with the dislocation distribution is slightly different in pure copper than in copper with addition of zirconium and evolves sianificantly during 4 or 8 ECAP passes in the case of pure copper.