Abstrakt
Dust in the space and in laboratory experiments is often exposed to energetic ions. During this process, the ions are implanted into the grain.
The grain can collect a significant charge that is spontaneously released due to ion field emission. To support the results of laboratory experiments on ion field emission, we adapted a TRIM-code (developed originally for a study of planar surfaces) on rotating spherical dust grains.
This model modification was verified on glassy carbon grains. The results indicate that the peak of distribution of implanted ions is closer to the surface of spherical grains than in planar samples in the case of a normal angle of incidence.
The output of the implantation model should serve as an input of the diffusion model and, finally, it will be implemented into the model of the ion field emission.