Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space

Abstract

Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space

Keywords

• Structural
• characterization
• self-assembled
• semiconductor
• islands
• three-dimensional
• X-ray
• diffraction
• mapping
• reciprocal
• space