Characterization of various crystalline structures at the SiO2/Si interface by positrons | Charles Explorer

Characterization of various crystalline structures at the SiO2/Si interface by positrons

Publication at Faculty of Mathematics and Physics |

2007

Abstract

Characterization of various crystalline structures at the SiO2/Si interface by positrons

Keywords

Characterization various crystalline structures SiO2/Si interface positrons

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