Further indication of low quartz structure at the SiO2/Si interface from coincidence Doppler broadening spectroscopy | Charles Explorer

Further indication of low quartz structure at the SiO2/Si interface from coincidence Doppler broadening spectroscopy

Publication |

2006

Abstract

Further indication of low quartz structure at the SiO2/Si interface from coincidence Doppler broadening spectroscopy

Keywords

Further indication quartz structure SiO2/Si interface coincidence Doppler broadening spectroscopy

Person