Combined EELS, LEED and SR-XPS study of ultra-thin crystalline layers of indium nitride on InP(100) Effect of annealing at 450 °C

Abstract

Combined EELS, LEED and SR-XPS study of ultra-thin crystalline layers of indium nitride on InP(100) Effect of annealing at 450 °C

Keywords

• Combined
• SR-XPS
• study
• ultra-thin
• crystalline
• layers
• indium
• nitride
• Effect
• annealing
• °C