Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles

Publication at Faculty of Mathematics and Physics |

2007

Abstract

Keywords

Atomic force microscopy transmission electron microscopy scanning electron microscopy nanoscale plate-shaped second phase particles

Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles

Abstract

Keywords

Person