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residuated
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X-ray residual stress measurement in titanium nitride thin films
Publication at Faculty of Mathematics and Physics
|
2006
1 person
Abstract
X-ray residual stress measurement in titanium nitride thin films
Keywords
X-ray
residual
stress
measurement
titanium
nitride
films
Person
person
RNDr. Milan Dopita Ph.D.
Faculty of Mathematics and Physics
