Density of Mn interstitials in (Ga,Mn)As epitaxial layers determined by anomalous x-ray diffraction

Abstract

Using anomalous x-ray diffraction around the MnK absorption edge we determined the density of Mn interstitials and its changes during annealing of epitaxial layers of (Ga,Mn)As.

Keywords

• Density interstitials
• (Ga
• Mn)As
• epitaxial layers
• anomalous x-ray diffraction