- Diffuse x-ray scattering from stacking faults in a-plane GaN epitaxiallayers2011 | Faculty of Mathematics and Physics
- Three-dimensional reciprocal space mapping of diffuse scattering for the study of stacking faults in semipolar (11(2)over-bar2) GaN layers grown from the sidewall of an r-patterned sapphire substrate2013 | Faculty of Mathematics and Physics