- Application of Cr K alpha X-ray photoelectron spectroscopy system to overlayer thickness determination2011 | Faculty of Mathematics and Physics
- Thickness determination of thin polycrystalline films by grazing incidence X-ray diffraction2004 | Faculty of Mathematics and Physics, Central Library of Charles University
- Thickness determination of thin polycrystalline film by grazing incidence X-ray diffraction2001 | Faculty of Mathematics and Physics, Central Library of Charles University
- Thickness determination of thin plycrystalline films by low angle incidence diffraction2002 | Publication without faculty affiliation
- Thickness determination of thin polycrystalline film by low angle incidence x-ray diffraction2002 | Publication without faculty affiliation
- Thickness determination of thin polycrystalline film by asymmetric X-ray diffraction with variable incidence of primary beam at low angles2001 | Faculty of Mathematics and Physics, Central Library of Charles University
- Opening angle of human saphenous vein2015 | Third Faculty of Medicine
- Ion scales of quasi-perpendicular low-Mach-number interplanetary shocks2013 | Faculty of Mathematics and Physics
- Depth profiling of ultra-thin alumina layers grown on Co(0001)2013 | Faculty of Mathematics and Physics
- Microstructure of Hexagonal LuFeO3 Thin Epitaxial Layers2022 | Faculty of Mathematics and Physics