- Application of Cr K alpha X-ray photoelectron spectroscopy system to overlayer thickness determination2011 | Faculty of Mathematics and Physics
- Hard-X-ray Photoelectron Diffraction from Si(001) Covered by a 0-7-nm-Thick SiO2 Layer2010 | Faculty of Mathematics and Physics
- The Interaction of Extreme Ultraviolet (XUV) Laser Radiation with Various Surfaces2010 | Faculty of Mathematics and Physics
- JUNO physics and detector2022 | Faculty of Mathematics and Physics